Testability-analysis driven test-generation of analogue cores
نویسندگان
چکیده
A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for testpattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach. q 2003 Elsevier Ltd. All rights reserved.
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عنوان ژورنال:
- Microelectronics Journal
دوره 34 شماره
صفحات -
تاریخ انتشار 2003